Modern Applied U-Statistics: By Kowalski, Jeanne, Tu, Xin M. | Kaicus Canada

Modern Applied U-Statistics: By Kowalski, Jeanne, Tu, Xin M.

Dive into the latest edition of Modern Applied U‑Statistics, where authors Jeanne Kowalski and Xin M. Tu weave cutting‑edge theory with hands‑on examples from bioinformatics to finance, highlighting efficient resampling algorithms, high‑dimensional extensions, and real‑world case studies that illuminate modern inference challenges.

Brand: Wiley-Blackwell (an imprint of John Wiley & Sons Ltd)
ISBN: 0471682276
MPN: Illustrations
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