Defects Spectroscopy in Silicon Diodes: Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage

68.74 EUR 2% Off 69.90 EUR

Marke: Nicolò Barbero

ISBN: 9783639773040

Gesponsert Diese Website enthält Affiliate-Links, für die wir möglicherweise eine Vergütung erhalten. Weitere Informationen

-2%

Gesponsert Defects Spectroscopy in Silicon Diodes: Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage

68.74 EUR 69.90 EUR

04-06-2026 00:23:10

Access to the deal

69.90 EUR 69.90 EUR

04-06-2026 06:38:09

Access to the deal