Name: Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Brand: Jacopo Franco
SKU: ID12001415
Availability: InStock

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

101.94 EUR 5% Off 106.99 EUR

Ein praxisorientiertes Buch, das die Lebensdauer und Stabilität von Hochmobilitäts‑SiGe‑Kanals-MOSFETs untersucht, ihre Rolle in zukünftigen CMOS‑Schaltungen beleuchtet und Optimierungstipps für Entwickler bietet.

Marke: Jacopo Franco

MPN: 219 black & white illustrations, biograp

ISBN: 9400776624

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Gesponsert Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics, Band 47)

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101.94 EUR 106.99 EUR

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Gesponsert Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Gesponsert Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics, Band 47)

Gesponsert Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Gesponsert Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics, Band 47)

Gesponsert Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

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