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Kaicus Medien Bücher From Contamination to Defects, Faults and Yield Loss: Simulation and Applications
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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

102.14 EUR 5% Off 106.99 EUR

Marke: Springer US
ISBN: 146128595X
MPN: 19302498
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Gesponsert From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing) (Frontiers in Electronic Testing, 5, Band 5)

102.14 EUR 106.99 EUR
27-04-2026 20:32:46
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Gesponsert From Contamination to Defects, Faults and Yield Loss

106.99 EUR 106.99 EUR
27-04-2026 21:56:14
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