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Kaicus Medien Bücher From Contamination to Defects, Faults and Yield Loss: Simulation and Applications
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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

102.84 EUR 13% Off 118.00 EUR

Marke: Springer US
ISBN: 146128595X
MPN: 19302498
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Gesponsert From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing) (Frontiers in Electronic Testing, 5, Band 5)

102.84 EUR 118.00 EUR
06-09-2026 23:29:09
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Gesponsert From Contamination to Defects, Faults and Yield Loss

118.00 EUR 118.00 EUR
07-09-2026 11:17:47
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