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Kaicus Medien Bücher From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)
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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)

106.60 EUR 0% Off 106.99 EUR

Marke: Springer
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Gesponsert From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)

106.60 EUR 106.99 EUR
24-04-2026 08:06:36
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Gesponsert From Contamination to Defects, Faults and Yield Loss

106.99 EUR 106.99 EUR
24-04-2026 08:11:55
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