Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems | Kaicus Deutschland
All categories
Kaicus
Baby & Kleinkind
Bekleidung & Accessoires
Bürobedarf
Elektronik
Fahrzeuge & Teile
Für Erwachsene
Gesundheit & Schönheit
Heim & Garten
Heimwerkerbedarf
Kameras & Optik
Kunst & Unterhaltung
Medien
Möbel
Nahrungsmittel, Getränke & Tabak
Software
Spielzeuge & Spiele
Sportartikel
Taschen & Gepäck
Tiere & Tierbedarf
Wirtschaft & Industrie
UK España Italia Deutschland France
© 2026, Kaicus - Smart Shopping
All rights reserved
Kaicus Medien Bücher Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
product image
product image
product image
product image

Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development

149.84 EUR 9% Off 164.99 EUR

Marke: Way Kuo
ISBN: 0792381076
Gesponsert  Diese Website enthält Affiliate-Links, für die wir möglicherweise eine Vergütung erhalten. Weitere Informationen
-9%

Gesponsert Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development

149.84 EUR 164.99 EUR
16-09-2026 04:41:28
Access to the deal

Gesponsert Reliability, Yield, and Stress Burn-In

164.99 EUR 164.99 EUR
18-09-2026 10:11:34
Access to the deal

Ähnliche Produkte

Optimal Reliability Design

71.70 EUR 75.99 EUR
Produkt anzeigen

Design for Yield and Reliability for Nanometer CMOS Digital Circuits

59.90 EUR 59.99 EUR
Produkt anzeigen

Quality and Reliability of Technical Systems

139.09 EUR
Produkt anzeigen

The DevOPS Handbook: How to Create World-Class Agility, Reliability, and Security in Technology Organizations

13.49 EUR
Produkt anzeigen